MEMS cantilever Type
MEMS cantilever probe is produce in to 3D shape using precise MEMS process technology. It is applied to products testing DRAM or CMOS Image sensor, for it has low level of noise and high quality electric characteristics.
MEMS cantilever Type can maximize test efficiency by testing numerous chips simultaneously (Multi-Para), and we are the leading company in the probe cards for CMOS Image sensor test.
|Application||CMOS Image Sensor (CIS)||DRAM|
|Illumination type||Diffusion filter||Lenz||–|
|Min. probe pitch||85㎛||64㎛|
|Max. parallelism||64para / 169para (FWC type)||256para|
|Max. test speed||2 Gsps (3.5 Gsps under development)||–|
|Temp. range||-40℃ ~ 150℃|